000			01669 a2200397 4500
001			58819
999			_c58819 _d15028
003			TR-AnTOB
005			20211216083104.0
008			070131s2005 njua b 001 0 eng
010			_a2005048977
020			_a0471383767 (acid-free paper)
040			_aDLC _cDLC _dDLC
041			_aeng
042			_apcc
050			_aQA274.42 _b.L69 2005
090			_aQA274.42 .L69 2005
100			_aLowen, Steven Bradley, _d1962- _931356
245		0	_aFractal-based point processes / _cSteven Bradley Lowen, Malvin Carl Teich.
264		1	_aHoboken, N.J. : _bWiley-Interscience, _c2005.
300			_axxiv, 594 p. : _bill. ; _c24 cm.
504			_aIncludes bibliographical references (p. 513-565) and index.
650		0	_aFractals _92424
650		0	_aPoint processes _931358
650		7	_aNokta işleme _2etuturkob _931359
650		7	_aFraktallar _2etuturkob _931360
700			_aTeich, Malvin Carl _931357
856		4	_uhttp://www.loc.gov/catdir/toc/fy0602/2005048977.html _3Table of contents only
857		4	_uhttp://www.loc.gov/catdir/enhancements/fy0625/2005048977-b.html _3Contributor biographical information
858		4	_uhttp://www.loc.gov/catdir/enhancements/fy0625/2005048977-d.html _3Publisher description
901			_a0018103
902			_aGT
906			_a7 _bcbc _corignew _d1 _eocip _f20 _gy-gencatlg
925		0	_aacquire _b2 shelf copies _xpolicy default
955			_djp18 2005-05-02 to SL _ejp18 2005-05-02 to Dewey _fCIP ver jp43 2005-10-20 _gjp43 2005-10-20 to BCCD
942			_cBK