000 01821 a2200433 4500
001 57690
999 _c57690
_d14706
003 TR-AnTOB
005 20201023143130.0
008 061223s2004 njua b 001 0 eng
010 _a2003063762
020 _a0471221767 (acid-free paper)
040 _aDLC
_cDLC
_dDLC
041 _aeng
042 _apcc
050 _aQA166.17
_b.M37 2004
090 _aQA166.17 .M37 2004
100 _aMarchette, David J.
_930347
245 0 _aRandom graphs for statistical pattern recognition /
_cDavid J. Marchette.
264 1 _aHoboken, N.J. :
_bWiley-Interscience,
_cc2004.
300 _axiii, 237 p. :
_bill. ;
_c25 cm.
490 0 _aWiley series in probability and statistics
504 _aIncludes bibliographical references (p. 213-227) and indexes.
650 _aPattern perception
_xStatistical methods
_928994
650 0 _aRandom graphs
_930348
650 7 _aRastgele grafikler
_2etuturkob
_930349
650 _aÖrüntü algısı
_xİstatistiksel metodlar
_928993
650 _aÖrüntü tanıma sistemleri
_928222
650 _aPattern recognition systems
_91133
856 4 _uhttp://www.loc.gov/catdir/bios/wiley044/2003063762.html
_3Contributor biographical information
857 4 _uhttp://www.loc.gov/catdir/description/wiley041/2003063762.html
_3Publisher description
858 4 _uhttp://www.loc.gov/catdir/toc/wiley041/2003063762.html
_3Table of contents
901 _a0017862
902 _aGT
906 _a7
_bcbc
_corignew
_d1
_eocip
_f20
_gy-gencatlg
925 0 _aacquire
_b2 shelf copies
_xpolicy default
955 _ejp14 2003-11-12 to Dewey
_fjp99 2004-03-17
_gjp18 2004-03-23 to BCCD
942 _cBK