000 00989 a2200277 4500
001 11527
999 _c11527
_d32763
003 TR-AnTOB
005 20200421121825.0
008 130405s1992 nyua b 001 0
020 _a002329180X
035 _aocm23357602
040 _aDLC
_cDLC
_dCUY
041 _aeng
050 0 _aTS156
_b.D53 1992
090 _aTS156 .D53 1992
100 1 _aDeVor, Richard E.
_93576
245 0 _aStatistical quality design and control :
_bcontemporary concepts and methods /
_cRichard E. DeVor, Tsong-how Chang, John W. Sutherland.
264 1 _aNew York :
_aToronto :
_aNew York :
_bMaxwell Macmillan International,
_cc1992.
300 _axvi, 809 p. :
_bill. (some col.) ;
_c25 cm.
504 _aIncludes bibliographical references (p. 780-786) and index.
650 0 _aQuality control
_xStatistical methods
_917740
650 0 _aProcess control
_xStatistical methods
_9649
700 1 _aChang, Tsong-how
_93577
700 1 _aSutherland, John W.,
_q(John William),
_d1958-
_93578
942 _cBK