MARC details
| 000 -LEADER |
|---|
| fixed length control field |
01561 a2200373 4500 |
| 001 - CONTROL NUMBER |
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| control field |
74115 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
TR-AnTOB |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20200607111905.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
090317s2008 gw 00100 eng |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
9783540738862 |
|
|---|
| International Standard Book Number |
354073886X |
| 041 ## - LANGUAGE CODE |
|---|
| Language code of text/sound track or separate title |
İngilizce |
| 050 #0 - LIBRARY OF CONGRESS CALL NUMBER |
|---|
| Classification number |
TA417.23 |
| Item number |
.F85 2008 |
| 090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN) |
|---|
| Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) |
TA417.23 .F85 2008 |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Fultz, Brent |
| 9 (RLIN) |
53184 |
| 245 #0 - TITLE STATEMENT |
|---|
| Title |
Transmission electron microscopy and diffractometry of materials / |
| Statement of responsibility, etc. |
Brent Fultz, James Howe. |
| 264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
|---|
| Place of production, publication, distribution, manufacture |
Berlin ; |
| -- |
New York : |
| Name of producer, publisher, distributor, manufacturer |
Springer, |
| Date of production, publication, distribution, manufacture, or copyright notice |
2008. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xix, 758 p. : |
| Other physical details |
ill. ; |
| Dimensions |
24 cm. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
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| Bibliography, etc. note |
|
|
|---|
| Bibliography, etc. note |
|
| 505 ## - FORMATTED CONTENTS NOTE |
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| Formatted contents note |
Diffraction and the x-ray powder diffractometer -- |
| Title |
The TEM and its optics -- |
| -- |
Scattering -- |
| -- |
Inelastic electron scattering and spectroscopy -- |
| -- |
Diffraction from crystals -- |
| -- |
Electron diffraction and crystallography -- |
| -- |
Diffraction contrast in TEM images -- |
| -- |
Diffraction lineshapes -- |
| -- |
Patterson functions and diffuse scattering -- |
| -- |
High-resolution TEM imaging -- |
| -- |
High-resolution STEM imaging -- |
| -- |
Dynamical theory. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
X-ray diffractometer |
| 9 (RLIN) |
53189 |
|
|---|
| Topical term or geographic name entry element |
X-ray difraktometre |
| Source of heading or term |
etuturkob |
| 9 (RLIN) |
53190 |
|
|---|
| Topical term or geographic name entry element |
Transmisyon elektron mikroskopi |
| 9 (RLIN) |
53188 |
|
|---|
| Topical term or geographic name entry element |
Transmission electron microscopy |
| 9 (RLIN) |
53187 |
|
|---|
| Topical term or geographic name entry element |
Malzemeler |
| General subdivision |
Mikroskopi |
| 9 (RLIN) |
53186 |
|
|---|
| Topical term or geographic name entry element |
Materials |
| General subdivision |
Microscopy |
| 9 (RLIN) |
31291 |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Howe, James M., |
| Dates associated with a name |
1955- |
| 9 (RLIN) |
53185 |
| 902 ## - LOCAL DATA ELEMENT B, LDB (RLIN) |
|---|
| a |
0028357 |
| 903 ## - LOCAL DATA ELEMENT C, LDC (RLIN) |
|---|
| a |
Merkez Kütüphane |
| 945 ## - LOCAL PROCESSING INFORMATION (OCLC) |
|---|
| a |
OG,CS |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Koha item type |
Book |
