MARC details
| 000 -LEADER |
| fixed length control field |
02557 a2200325 4500 |
| 001 - CONTROL NUMBER |
| control field |
73825 |
| 003 - CONTROL NUMBER IDENTIFIER |
| control field |
TR-AnTOB |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
| control field |
20210409102035.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
| fixed length control field |
090218s2008 sg a b 00010 eng |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
| International Standard Book Number |
9780470822982 (cloth : alk. paper) |
|
| International Standard Book Number |
0470822988 (cloth : alk. paper) |
| 040 ## - CATALOGING SOURCE |
| Original cataloging agency |
DLCcDLCdBAKERdBWXdYDXCPdUtOrBLW |
| Transcribing agency |
TR-AnTOB |
| 041 ## - LANGUAGE CODE |
| Language code of text/sound track or separate title |
İngilizce |
| 050 ## - LIBRARY OF CONGRESS CALL NUMBER |
| Classification number |
TA403 |
| Item number |
.L46 2008 |
| 090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN) |
| Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) |
TA403 .L46 2008 |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
| Personal name |
Leng, Yang |
| 9 (RLIN) |
52279 |
| 245 #0 - TITLE STATEMENT |
| Title |
Materials characterization : |
| Remainder of title |
introduction to microscopic and spectroscopic methods / |
| Statement of responsibility, etc. |
Yang Leng. |
| 264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
| Place of production, publication, distribution, manufacture |
Singapore ; |
| -- |
Hoboken, NJ : |
| Name of producer, publisher, distributor, manufacturer |
J. Wiley, |
| Date of production, publication, distribution, manufacture, or copyright notice |
c2008. |
| 300 ## - PHYSICAL DESCRIPTION |
| Extent |
xii, 337 p. : |
| Other physical details |
ill. ; |
| Dimensions |
26 cm. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
| Bibliography, etc. note |
|
| 505 ## - FORMATTED CONTENTS NOTE |
| Formatted contents note |
X-ray Radiation--Light Microscopy-- |
| -- |
Optical Principles -- |
| -- |
Instrumentation-- |
| -- |
Specimen Preparation -- |
| -- |
Imaging Modes -- |
| -- |
Confocal Microscopy -- |
| -- |
X-ray Diffraction Methods -- |
| -- |
Theoretical Background of Diffraction -- |
| -- |
X-ray Diffractometry-- |
| -- |
Transmission Electron Microscopy-- |
| -- |
Instrumentation-- |
| -- |
Specimen Preparation -- |
| -- |
Image Modes -- |
| -- |
Selected Area Diffraction -- |
| -- |
Images of Crystal Defects -- |
| -- |
Scanning Electron Microscopy -- |
| -- |
Instrumentation-- |
| -- |
Contrast Formation -- |
| -- |
Operational Variables -- |
| -- |
Specimen Preparation -- |
| -- |
Scanning Probe Microscopy -- |
| -- |
Instrumentation -- |
| -- |
Scanning Tunneling Microscopy -- |
| -- |
Atomic Force Microscopy -- |
| -- |
Image Artifacts -- |
| -- |
X-ray Spectroscopy for Elemental Analysis -- |
| -- |
Features of Characteristic X-rays -- |
| -- |
X-ray Fluorescence Spectrometry -- |
| -- |
Energy Dispersive Spectroscopy in Electron Microscopes -- |
| -- |
Qualitative and Quantitative Analysis -- |
| -- |
Electron Spectroscopy for Surface Analysis -- |
| -- |
Basic Principles -- |
| -- |
Instrumentation-- |
| -- |
Characteristics of Electron Spectra -- |
| -- |
Qualitative and Quantitative Analysis -- |
| -- |
Secondary Ion Mass Spectrometry for Surface Analysis -- |
| -- |
Basic Principles -- |
| -- |
Instrumentation-- |
| -- |
Surface Structure Analysis -- |
| -- |
SIMS Imaging -- |
| -- |
SIMS Depth Profiling -- |
| -- |
Vibrational Spectroscopy for Molecular Analysis -- |
| -- |
Theoretical Background -- |
| -- |
Fourier Transform Infrared Spectroscopy -- |
| -- |
Raman Microscopy -- |
| -- |
Interpretation of Vibrational Spectra -- |
| -- |
Thermal Analysis -- |
| -- |
Common Characteristics -- |
| -- |
Differential Thermal Analysis and Differential Scanning Calorimetry-- |
| -- |
Thermogravimetry -- |
| -- |
Index |
| 650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM |
| Topical term or geographic name entry element |
Malzemeler |
| Source of heading or term |
etuturkob |
| 9 (RLIN) |
59534 |
|
| Topical term or geographic name entry element |
Materials |
| 9 (RLIN) |
1533 |
|
| Topical term or geographic name entry element |
Materials |
| General subdivision |
Analysis |
| 9 (RLIN) |
52280 |
|
| Topical term or geographic name entry element |
Malzemeler |
| General subdivision |
Analiz |
| 9 (RLIN) |
52281 |
| 902 ## - LOCAL DATA ELEMENT B, LDB (RLIN) |
| a |
0028144 |
| 903 ## - LOCAL DATA ELEMENT C, LDC (RLIN) |
| a |
Merkez Kütüphane |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
| Koha item type |
Book |
| Source of classification or shelving scheme |
Library of Congress Classification |
| 945 ## - LOCAL PROCESSING INFORMATION (OCLC) |
| a |
MC, CS |